smartctl 5.40 2010-03-16 r3077 [i686-pc-linux-gnu] (local build) Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Device Model: SAMSUNG HM500JI Serial Number: S1WFJD0S929084 Firmware Version: 2AC101C4 User Capacity: 500,107,862,016 bytes Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 8 ATA Standard is: ATA-8-ACS revision 6 Local Time is: Thu Jul 21 23:08:45 2011 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (7800) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 130) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 0 2 Throughput_Performance 0x0026 252 252 000 Old_age Always - 0 3 Spin_Up_Time 0x0023 090 087 025 Pre-fail Always - 3300 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 379 5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0 8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 3096 10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 110 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 372 191 G-Sense_Error_Rate 0x0022 100 100 000 Old_age Always - 6 192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0 194 Temperature_Celsius 0x0002 064 057 000 Old_age Always - 32 (Lifetime Min/Max 16/44) 195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0 196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0036 100 100 000 Old_age Always - 11 200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 286 223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 110 225 Load_Cycle_Count 0x0032 081 081 000 Old_age Always - 196766 SMART Error Log Version: 1 ATA Error Count: 1 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 1 occurred at disk power-on lifetime: 790 hours (32 days + 22 hours) When the command that caused the error occurred, the device was doing SMART Offline or Self-test. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 00 00 00 a0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ec 00 00 00 00 00 a0 00 00:01:08.073 IDENTIFY DEVICE 00 00 01 01 00 00 00 00 00:01:08.073 NOP [Abort queued commands] ef 03 46 00 00 00 a0 00 00:01:08.072 SET FEATURES [Set transfer mode] ec 00 00 00 00 00 a0 00 00:01:08.072 IDENTIFY DEVICE 00 00 01 01 00 00 00 00 00:01:08.072 NOP [Abort queued commands] SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Completed [00% left] (0-65535) 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.